Collect. Czech. Chem. Commun. 1988, 53, 425-432
https://doi.org/10.1135/cccc19880425

X-ray photoelectron spectroscopic (XPS) studies of iodine oxocompounds

Zdeněk Bastl and Heidrun Gehlmann

ESCA Center, The Heyrovský Institute of Physical Chemistry and Electrochemistry Czechoslovak Academy of Sciences, 121 38 Prague 2

Abstract

The core electron binding energies of eighteen compounds containing iodine in different oxidation states ranging from (-I) to (VII) have been measured. The observed chemical shifts differ from the literature data. The anticipated existence of hexavalent iodine in certain compounds has not been demonstrated. The relative subshell photoemission intensities of iodine have been determined. Empirically derived atomic sensitivity factors and theoretical photoionization cross-sections have been used to calculate the surface stoichiometry. The concentration ratios obtained via the two methods are compared. In agreement with generally accepted view the results of this comparison imply that, for quantitative surface analysis, empirical values should be used rather than theoretical data.